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21330-25 - Substratek™
or contact resonance
Operation manual
996") in diameter with an overall height
SEM Low Magnification Ruler Disc (275KB PDF)
HS-20MG Tempfix™ 21330-25 - Substratek™Height Calibration Standard, 20 nm DESCRIPTION Height Calibration Standard, 20 nm The problem: Atomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated. The solution: HS 20MG is one of the height standards introduced by BudgetSensors as a
