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In July 2015 Bruker implemented a new process to achieve higher quality and consistency in this probe's physical appearance and dimensions
Electrostatic Force Microscopy (EFM) probe holder for the Multimode SPM
This stainless steel probe holder enables electric field gradient imaging for the MultiMode SPM
-- Seals cell against cover glass (EC-V2-CO VER GLASS) upon engage
They have near vertical sidewallsand aspect ratios of more than 10:1
Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM AFM/STM Disks In July 2015 Bruker implementedDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um
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US$ 179.00
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