Pay in 4 interest-free payments of $528.35 Learn more
Ships within 48 hours · Estimated delivery Oct 13 - Oct 18
Precision-cut Platinum/Iridium wire for Scanning Tunneling Microscopy
Automatic image optimization for faster
Cantilever Material: Silicon Nitride Cantilever Thickness (Nom): 0
Focused Ion Beam (FIB) probes consist of an integrated single crystal TESP silicon cantilever and tip that have been machined (or shaped) toobtain the desired high aspect ratio
5+/-5 Tip Radius (Nom): 20 Tip Coating: Highly conductive single cystal diamond Tip Set Back (Nom): 15-25 Tilt Compensation: 0 +/- 1
MFMA 150 kHz Precision-cut Platinum/Iridium wire for ScanningForce Modulation cantilever holder DESCRIPTION TIP SPECIFICATIONS This stainless steel cantilever holder includes a large piezo to drive the tip for low frequency, high amplitude force imaging in air. It can also be used for Tapping and Contact modes. This option includes a force imaging support note and a set of probes. Not compatible with LFM SPMs. This stainless steel cantilever holder includes a large piezo to drive the tip for low frequency, high
US$ 172.50
US$ 135.00
US$ 2875.00
US$ 166.00
US$ 152.00
US$ 89.95
US$ 79.95
US$ 60.95
US$ 75.95
US$ 85.95
US$ 68.95
