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Ships within 48 hours · Estimated delivery Nov 5 - Nov 10
Max Width = 50 nm
electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM)
No reflective coating
Rectangular & Triangular Cantilevers Number: 6 Back Side Coating: Reflective Gold
It is a zinc sulfide window mounted on a magnetic sample puck with two different microtomed samples on it
DSCMSCH Critical Dimension (Overhang) Max Width = 50 nmSCM cantilever holder for Dimension series SPMs DESCRIPTION This SCM cantilever holder supports the Scanning Capacitance Microscopy (SCM) application module for Dimension BioScope SPMs. The integrated piezo can be actuated for TappingMode or LiftMode operation. The holder comes with a short cable for connection to the SCM application module.
