Low Magnification Calibration Ruler 0.2 N/m ighter dimensional specifications for improved

ighter dimensional specifications for improved probe to probe consistency

providing sample heating and temperature control in liquids

and development of precisionmetrology methods

Specifications of the silicon substrate used: prime virgin silicon wafer

Tapping Mode AFM Probe

Low Magnification Calibration Ruler 0.2 N/m ighter dimensional specifications for improvedDESCRIPTION 100 markings, divisions 0. 01mm on disc Calibration ruler on 1 8" (3. 2mm) nickel plated copper disc. 1mm long scale with 100 markings, with 0. 01mm divisions with an accuracy of + 0. 0005mm or better. Available unmounted, or mounted on SEM mounts. PELCO Technical Notes, SEM Low Magnification Ruler Disc (275KB PDF) See information on mounts A R