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Ships within 48 hours · Estimated delivery Sep 22 - Sep 27
The small 12mm diameter
especially at the nano scale
FIB: Can be used for a wide range of accelerating voltage (1kV-20kV) and calibrates images from 5kX to 200kX
3deg tilt compensation DESCRIPTION
Precision holographic pattern for accurate calibration for high resolution
Thin Specimen Split Mount (AMRAY) Automated AFM The small 12mm diameterDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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US$ 159.43
