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Dual Geological Thin Section Holder TEM/STEM Test Specimens Other applications of this probe

SKU: 71871450208

4.4
EUR239.25 EUR269.25

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Description

Other applications of this probe include: Scanning Capacitance Microscopy (SCM)

16180 - Aluminum Mini Pin Stub with 9

the glue may be softened with the Glue Gun

you know what to look for and what to expect

145nm Very High Resolution AFM Reference Standard

Dual Geological Thin Section Holder TEM/STEM Test Specimens Other applications of this probeDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

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