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PELCO® NiOx Test Specimen for Analytical Electron Microscopy (AEM) Soft Tapping Mode Feedback loop enables precise and

SKU: 66463764393

4.6
USD285.73 USD329.73

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Ships within 48 hours · Estimated delivery Oct 11 - Oct 16

Description

Feedback loop enables precise and consistent coating thickness

Takes less space with a head diameter of 6

56-75 - Highest Grade V1 Mica

2mm (5-7/8")

Made of strong reinforced plastic

PELCO® NiOx Test Specimen for Analytical Electron Microscopy (AEM) Soft Tapping Mode Feedback loop enables precise andDESCRIPTION inexpensive characterization of instrument performance The NiOx Test Specimen has been developed for advanced analytical TEM's equipped with X Ray Micro Analysis Systems (EDX) and or Electron Energy Loss Spectrometers (EELS) to characterize instrument performance. It consists of a 55nm layer of NiOx on a 25nm carbon support film on a 200 mesh Mo TEM grid. The NiOx Test Specimen is valuable in at least three ways: When evaluating TEM's and

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