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These probesare ideal for C-AFM
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2
and their combination with PeakForce QNM
Includes a subset of PeakForce QNM samples
- Probe holder for application module-equipped MultiMode SPMs
DDESP-FM-V2 1 N/m These probesare ideal for C-AFM6 N m, 105 kHz, Conductive Doped Diamond Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker DDESP FM V2 Electrical Probes Providing consistent performance and high sensitivity. Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and
