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Ø32mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems Unit:pkg/100 55 Cantilever Thickness (RNG): 0

SKU: 63179226466

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Description

55 Cantilever Thickness (RNG): 0

Technical Notes (PDF 79KB) TEM substrates on 300 mesh TEM grids

Small feature sizes do not obscure sample features

16508-P -Highly Polished Carbon Planchets

Scanning probe microscopes have a pattern that is closely sized to the finest cantilever tips challenging their resolution ability

Ø32mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems Unit:pkg/100 55 Cantilever Thickness (RNG): 0DESCRIPTION 32mm x 6mm pin height; shorter pin for all Zeiss LEO SEM, FESEM & FIB systems ZEISS LEO SEM, FESEM & FIB systems, aluminum, grooved edge, 32mm

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