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2 mill (600 - 690µm) Type P / <100>
Trace elements can be Si
Diamond Coated
The StrataTek™ TEM grids for Transmission Electron Microscopy have a thickness of 25µm and are manufactured using a micron-precision etching process of thin foils
The FastScan-C cantilevers utilize a novel 40 um long triangular Silicon Nitride cantilever to achieve a 300 kHz resonant frequency with only a 0
Multi Holder for 6 Pin Stubs Set 2 mill (600 - 690µm)DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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