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01895-F - Lacey Carbon
DNP probes have less than 2deg of cantilever bend
Maximum gap is 11mm (7/16")
The clips provide minimal surface clamping area and grounding on the imaged surface
This kit is used to mount most commercially available afm probes onto pre-aligned substrates for easy installation and alignment in the afm+ and nanoIR systems
Universal Springloaded Vise Bent Tips 01895-F - Lacey CarbonDESCRIPTION Interchangeable Modular SEM Specimen Holders This extensive line of specimen holders all have a female M4 thread and are compatible with all of our modular SEM Stage Adapters. If used with the Jeol or ZEISS LEO dovetail stage adapter one of the adapter buttons 15372 or 15372 10 is needed. Universal Springloaded Vise with Reversible Clamps, M4 shown holding a screw Springloaded vise clamp with reversible jaws for an opening up to 38mm. The
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