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15468 - PELCO® Double 1/2" FIB Sample and Grid Holder
Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices
Sold in packs of 25
108 Auto/SE
- At least 5 out of 10 probes reach >10 contrast (tip-in vs tip-out) on TERS-SMPL
New Style T-Base Adapter for Hitachi 15AP 15468 - PELCO® Double 1/2"DESCRIPTION New Style T Base Adapter for Hitachi S 4800, SU 70, SU6600, SU8200 and SU8000 series FESEMs Made of vacuum grade aluminum with counterpart for airlock manipulator and locking rod. Can be used with any of the Modular SEM Specimen Holders if the SEM stage travel permits this. Includes M4 screw.
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