SEM Magnification Standard and Stage Micrometer MRS-4 - Modification 5 kHz aluminum sheets of 10 x10

aluminum sheets of 10 x10 x 0

5 Side Angle: 2 ± 0

unknown hazard if any

I - 16043 SDS Part B (122KB PDF)

High resolution electrical imaging with a sharp conductive tip

SEM Magnification Standard and Stage Micrometer MRS-4 - Modification 5 kHz aluminum sheets of 10 x10DESCRIPTION Modify the MRS 4 to 3mm diameter x 0. 5mm thickness to fit into a TEM style holder. For use only in secondary or backscattered mode, not transmitted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies