Highly Oriented Pyrolytic Graphite – HOPG AFM/STM Disks IC devices and so on

IC devices and so on

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RESP-20

Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful

for information only Pitch: 3 ±0

Gilder Aperture Grids

Highly Oriented Pyrolytic Graphite – HOPG AFM/STM Disks IC devices and so onDESCRIPTION HOPG grade ZYB, 0. 8 10 x 10 mm x 1mm HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopes (SPM, STM and AFM). It may also be used as a calibration specimen. HOPG consists of layered planes of carbon atoms (002) which are highly oriented with respect to each other. HOPG grade ZYB with a mosaic spread of 0. 8 0. 2 with a grain size of up to 1m PELCO Technical Notes, Highly Ordered Pyrolytic Graphite