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including highly reflective samples
5º Back Angle: 17
Titanium roughness sample pre-mounted on 12mm magnetic sample disk
and to automatically make appropriate parameter adjustments
***Note: Bruker's new SCM-PIC-V2 probe replaces the legacy SCM-PIC probe
LTESPA-V2 55 kHz including highly reflective samples48N m, 190kHz, 4 Sided Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality long lever etched silicon probes for TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, LTESP LTESPA AFM probes. Brukers new line of LTESP high quality premium etched silicon probes set the industry standard for long
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