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Test Grating for Lateral Calibration Select:Test grating TG3D-3000/600, pillars, unmounted Hole Width 73µm

SKU: 50087439584

4.2
USD313.75 USD360.75

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Description

Hole Width 73µm

Index l is 75 mesh for the strong bars and each square is bisected in both directions with thinner bars

and a magnetic moment of 0

3 BAR PATTERNS from

70 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive Diamond Back Side Coating: Reflective Aluminum

Test Grating for Lateral Calibration Select:Test grating TG3D-3000/600, pillars, unmounted Hole Width 73µmDESCRIPTION The TG3D 3000 600 test grating with its 3 Dimensional array is intended for lateral calibration of SPM scanners, detection of lateral nonlinearity, hysteresis, creep, cross coupling effects and for determination of the tip aspect ratio. Structure: Si wafer with grating in top surface Pattern type: Chessboard like array of square pillars with sharp undercut edges Height: 0. 3 0. 6m Top square size: 1. 2 x 1. 2m Edge radius: 10nm Period: 3

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