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Representative CDMS-XY-1C Conformance Certificate (270KB PDF)
PELCO Low Profile SEMClip™ Specimen Mounts
minimum air and bubbles and is clean
Tin on Carbon
4mm (1") square sample surface and a standard 3
ContGB-G Hitachi Representative CDMS-XY-1C Conformance Certificate (270KBGold Coated Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Not
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