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5 Cantilever Geometry: Special Cantilevers Number: 1 Back Side Coating: Reflective Aluminum
The 10x to 200
electrically conductive tip that is ideal for various electrical characterization applications
Au substrates are also often used in material science studies
21320-25 - Substratek™
SEM Bulk Specimen Holder 10.4 N/m 5 Cantilever Geometry: Special CantileversDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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