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Replacement scanner springs for all V and VLH type scanners
Check Scan line profile and enlarged view of the tip apex
Max Overhang = 30 nm
5 Back Angle: 15 ± 2
Improved probe quality and aesthetics
SD-103 Hi-Res Replacement scanner springs for allSPM cross sectional sample holder DESCRIPTION SPM cross sectional sample holder for all Veeco SPMs. This cross sectional sample holder is designed to hold a wafer cross section upright for edge inspection and it can be used on all microscopes; However, cross section cannot be taller than the height supported by the microscope. It is 0. 5" in diameter and 0. 175" tall. Includes a hex key.
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