All-In-One-DLC Select Quantity:10 per set Screw used is M3 x

Screw used is M3 x 3mm

15µm for Ti

Scanning electron microscope (SEM and Focussed Ion Beam (FIB) system resolution is defined in terms of a combination of criteria: resolution and number of gray levels in the image

accurately cut for square edges

Both coatings are available on 50nm and 200nm PELCO® Silicon Nitride Membranes with a 0

All-In-One-DLC Select Quantity:10 per set Screw used is M3 xDiamond Like Carbon Coated AFM Probe with 4 Different Cantilevers for Various Applications DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Like Carbon Coated AFM Probe with 4 Different Cantilevers for Various Applications Versatile silicon AFM probe with 4 different cantilevers on a single AFM holder chip. Rotated, monolithic silicon AFM probe with symmetric tip shape for various applications (contact mode, force modulation mode,