01754-F - Formvar/Carbon 400 mesh
Specimen support with low X-ray background
Overall size is 48 x 48 x 10mm (1
Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features
50/50 mesh
Ceramic Tweezers, Serrated Tip Glue Gun 01754-F - Formvar/Carbon 400 meshDESCRIPTION 4 styles, smooth surface, low friction coeeficient, light weight, fully anti magnetic, contamination free, solder resistant, wear resistant and non conductive (thermally electrically) These full body Zirconia Ceramic Tweezers are useful for demanding requirements for high grade application in clean rooms, chemistry, semiconductor and electronics manufacturing, analytical chemistry, biotechnology and nanotechnology. The zirconia ceramic