Pay in 4 interest-free payments of $235.62 Learn more
Ships within 48 hours · Estimated delivery Sep 20 - Sep 25
high-amplitude force imaging in air
Periodically poled lithium niobate (PPLN)
Tipless cantilevers for Contact Mode or Fluid TappingMode imaging and force measurement with a variety of extremely low spring constants for high force sensitivity
Au coated tips
This is used with the NanoScope tip-evaluation software
VGRP-UM Unmounted Instrument high-amplitude force imaging in airCalibration artifact: 180nm step height, 10m pitch DESCRIPTION Calibration artifact, 180nm step height, 10m pitch. This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance. The silicon die with patternedlayer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST. Replaces model STR10 1800P.
US$ 179.26
US$ 89.99
US$ 148.55
US$ 127.71
US$ 176.28
US$ 111.76
US$ 499.94
