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The PELCO® Universal SEM Sample Holder Set extends the capabilities of your SEM by offering convenient sample holders for larger or awkwardly shaped samples
Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods
Screw used is M3 x 20mm
thermal stability in air up to 600°C and in vacuum or inert gas up to 3
with clear cover
Springloaded Vise Clamp Select:Vise Clamp The PELCO® Universal SEM SampleDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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