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Ships within 48 hours · Estimated delivery Oct 13 - Oct 18
not for Conductive or Tunneling AFM
FastScan-B probes are designed specifically for imaging in fluid on the Dimension FastScan AFM
7 Cantilever Thickness (RNG): 3
and has a proprietary design to improve the success rate of force pulling experiments
When used with Brukers exclusive PeakForce TUNA mode
AD-40-AS 25 nm not for Conductive or TunnelingSharp Conductive Single Crystal Diamond Probes, 40 N m, 180 kHz, 10 nm ROC, 5 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Sharp Conductive Single Crystal Diamond Probes, 40 N m, 180 kHz, 10 nm ROC, 5 Pack High spring constant, suitable for higher force and harder sample applications including: Topography imaging in PeakForce Tapping, Tappingmode, and contact mode. Electrical characterization with PeakForce TUNA, TUNA, CAFM.
