JN-1 SEM Demonstration Specimens Strong The special clean dicing process

The special clean dicing process involves coating the wafer with photo resist before dicing and removing it after dicing which produces debris-free SiO2 substratres

Structure geometry:

Solid metal probes offer excellent conductivity and suffer no thin-filmadhesion problems that occur with metal-coated silicon probes

Bruker's new line of MLCT-BIO high-quality

Magnetic Force Microscopy (MFM)

JN-1 SEM Demonstration Specimens Strong The special clean dicing processDESCRIPTION SAMPLE IMAGES The JN 1 Scanning Electron Microscope Demonstration Standard Specimen demonstration samples on two standard 12. 7mm (1 2") pin stubs and a 25mm mounting adapter. They allow for demonstrating any SEM at lower magnifications with known specimens. The variety of demonstration samples can also be used for training purposes. They are ideal for use on table top SEMs such as the JEOL NeoScope, Hitachi TM 1000 3000 3030, Phenom and